{"id":176,"date":"2019-02-01T15:51:14","date_gmt":"2019-02-01T14:51:14","guid":{"rendered":"https:\/\/site.uit.no\/nanoscopy\/?p=176"},"modified":"2019-02-01T20:46:04","modified_gmt":"2019-02-01T19:46:04","slug":"omx-blaze-structured-illumination-microscope","status":"publish","type":"post","link":"https:\/\/site.uit.no\/nanoscopy\/2019\/02\/01\/omx-blaze-structured-illumination-microscope\/","title":{"rendered":"OMX Blaze Structured Illumination Microscope"},"content":{"rendered":"<p>Our OMX Blaze system (GE Healthcare) is capable of 3D structured illumination microscopy (SIM), deconvolution microscopy (DV), total internal reflection microscopy (TIRF), localization microscopy (such as dSTORM or similar), and differential interference contrast microscopy (DIC). It features the following:<\/p>\n<ul>\n<li>405, 488, 568, and 642 nm lasers<\/li>\n<li>Solid state light source (for DV)<\/li>\n<li>3 sCMOS cameras<\/li>\n<li>On-stage incubator<\/li>\n<li>Photokinetic module (for FRAP, photoactivation, etc)<\/li>\n<li>UltimateFocus module (for finding and maintaining focus)<\/li>\n<li>SIM resolution of ~120 nm (lateral) and ~350 nm (axial)<\/li>\n<li>3D SIM acquisition as fast as 1 \u00b5m \/ second<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Our OMX Blaze system (GE Healthcare) is capable of 3D structured illumination microscopy (SIM), deconvolution microscopy (DV), total internal reflection microscopy (TIRF), localization microscopy (such as dSTORM or similar), and differential interference contrast microscopy (DIC). It features the following: 405, &hellip; <a href=\"https:\/\/site.uit.no\/nanoscopy\/2019\/02\/01\/omx-blaze-structured-illumination-microscope\/\">Continued<\/a><\/p>\n","protected":false},"author":1009,"featured_media":177,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[6],"tags":[5],"class_list":["post-176","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-infrastructure","tag-infrastructure"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v28.8 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>OMX Blaze Structured Illumination Microscope - Nanoscopy<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/site.uit.no\/nanoscopy\/2019\/02\/01\/omx-blaze-structured-illumination-microscope\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"OMX Blaze Structured Illumination Microscope - Nanoscopy\" \/>\n<meta property=\"og:description\" content=\"Our OMX Blaze system (GE Healthcare) is capable of 3D structured illumination microscopy (SIM), deconvolution microscopy (DV), total internal reflection microscopy (TIRF), localization microscopy (such as dSTORM or similar), and differential interference contrast microscopy (DIC). 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